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ITC - International Test Conference 2020

Marriot Wardman Park, Washington, District of Columbia
Nov 03 - Nov 05, 2020

Why Attend

International  Test  Conference  is  the  world’s  premier venuededicated  to  the  electronic  test  of devices,  boards  and  systems—covering  the  complete  cycle  from  design  verification,  design-for-test, design-for-manufacturing, silicon   debug,   manufacturing   test, system   test, diagnosis, reliability and failure analysis,and back to process and design improvement.  

ITC  2020  starts  the  second  half  century  of  the  conference.  Emerging  technologies  such  as optical,  biomedical,  and  quantum  devices  willrequire  new  test  solutions.    Artificial  Intelligence (AI)   and   the   need   for   trustworthy   devices   are   providing   both   new   challenges   and   new opportunities for off-chip and on-chip test. At the same time, more stringent quality requirements, especially  in  automotive  applications,are  requiring  more  efficient  test,  debug,  monitoring,  and repair techniques that can transfer to the field.

Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. Of particular interest areworksdedicated to the topics listed on the right and/or works related  to  the  conference  theme  and/or works focused  onspecial  trackssuch  as Automotive, AI, or Security.Authors are also invited to submit practical,industry best practicespapers. Submissions   simultaneously under   reviewor   accepted   by   another   conference, symposium or journal, will be summarily rejected.

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